Alessandro Tredicucci
University Pisa,Pisa Italy;
Antoni Rogalski
Institute of Applied Physics, Military University of Technology,Warsaw, Poland;
BECKER C R,
Physical Institute of the University
Wurzburg,Wurzburg, Germany;
CAI Yi (蔡毅),
Kunming Institute of Physics,Kunming, China;
CAO Jun-Cheng(曹俊诚)
Shanghai Institute of Microsystem and Information Technology,Shanghai,China;
CHEN Fan-Sheng(陈凡胜),
SITP,Shanghai,China;
DAI Ning(戴宁),
DU Chao-Hai(杜朝海)
Beijing University,Beijing,China;
FANG Jia-Xiong(方家熊),
FENG Song-Lin(封松林),
FENG Zheng-He(冯正和),
Tsinghua University,Beijing,China;
FU Y,
Royal Institute of Technology,
Goteborg Sweden;
GAO JianJun(高建军),
East China Normal University,Shanghai,China;
GE Jun(葛军),
GE Wei-Kun(葛维琨),
Hong Kong University of Science and Technology,Hongkong,China;
GONG Hui-Xing(龚惠兴),
GUI Yong-Sheng(桂永胜),
University of Manitoba,Manitoba,Canada;
HAN Jian-Zhong(韩建忠),
CETC,Beijing,China;
HE Zhi-Ping(何志平),
HU Min(胡旻),
UESTC,Chengdu,China
HU Wei-DA(胡伟达)
HU Zhi-Gao(胡志高),
HUANG Da-Ming(黄大鸣),
Fudan University, Shanghai, China;
HUANG Zhi-Ming(黄志明)
LIU Pu-Kun(刘濮鲲),
LUO Qing-Ming(骆清铭),
Hainan University, Haikou, China;
NIU Zhi-Chuan(牛智川)
Institute of Semiconductors,Beijing,China;
NEMIROVSKY Y,
Technion-Israel Institute of Technology,Technion City, Israel;
Manijeh Razeghi,
Northwestern University,USA
PAN DeLu(潘德炉),
Second Institute of Oceanography,Beijing,China;
QIU Kang-Mu(邱康睦),
National Satellite Meteorological Center,Beijing,China;
Rui Q. Yang,
University of Oklahoma,,Oklahoma,U.S.A;
SAKAI K,
Kansai Advanced Research Center,Kobe, Japan;
SHEN WenZhong(沈文忠),
Shanghai Jiaotong University,Shanghai,China;
SHEN Xue-Chu(沈学础),
Sivalingam Sivananthan,
University of Illinois ,Chicago, U.S.A.;
SIZOV F F,
Institute of Semiconductor Physics,Kiev, Ukraine;
SUN Xiao-Wei(孙晓玮),
WU Hui-Zhen(吴惠桢),
Zhejiang University,Hangzhou,China;
WU Qun(吴群),
Harbin Institute of Technology,Harbin,China;
WU Xiao-Guang(吴晓光),
Institute of Semiconductors , CAS,Beijing,China;
XIA Yi-Ben(夏义本),
Shanghai University,Shanghai,China;
XU Jing-Jun(许京军),
Nankai University,Tianjin,China;
XU He-Xiu(许河秀),
Air Force Engineering University,Xi'an,China;
XU Gang-Yi(徐刚毅),
XU Shan-Jia(徐善驾),
University of Science and Technology of China,Hefei,China;
YANG Jie(杨杰),
YE Zhen-Hua(叶振华),
Yong-Hang Zhang,
Arizona State University,Arizona,U.S.A;
YU Guo-Fen(余国芬),
University of Electronic Science and Technology of China,Chengdu,China;
YU Wen-Xian(郁文贤),
Yu.P.Yakovlev
Ioffe Physical-Technical Institute RAS,St.Petersburg, Russia;
ZHANG Bing(张兵)
AIR,CAS,Beijing,China;
ZHANG Jian-Qi(张建奇),
Xidian University,Xi'an,China;
ZHANG Tian-Xu(张天序),
Huazhong University of Science and Technology,Wuhan, China;
ZHANG X C,
Rensselaer Polytechnic Institute,Rensselaer,USA;
ZHANG XinYi(张新夷),
Fudan University,Shanghai,China;
ZHENG You-Liao(郑有炓),
Nanjing University,Nanjing,China;
ZHOU Li-Wei(周立伟),;
Beijing Institute of Technology,Beijing,China
ZHUANG Zhao-Wen(庄钊文),
National University of Defense Technology,Changsha,China;
ZRENNER A,
University of Paderborn,Paderborn, Germany