The ‘swallow-tailed defect’ in MBE HgCdTe film
Received:March 12, 2020  Revised:November 22, 2020  download
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Author NameAffiliationPostcode
YANG Jin Kunming Institute of Physics Kunming 650223 China 650223
KONG Jin-Cheng Kunming Institute of Physics Kunming 650223 China 650223
YU Jian-Yun Kunming Institute of Physics Kunming 650223 China 
LI Yan-Hui Kunming Institute of Physics Kunming 650223 China 
YANG Chun-Zhang Kunming Institute of Physics Kunming 650223 China 
QIN Gang Kunming Institute of Physics Kunming 650223 China 
LI Dong-Sheng Kunming Institute of Physics Kunming 650223 China 
LEI Wen Kunming Institute of Physics Kunming 650223 China 
ZHAO Jun Kunming Institute of Physics Kunming 650223 China 
JI Rong-Bin Kunming Institute of Physics Kunming 650223 China 
Abstract:The swallow-tailed defect is a typical defect in MBE HgCdTe which has a uniform and regular shape. The morphology, structure and growth mechanism of swallow-tailed defect were investigated. Two raised swallow-tails are major characteristic on the surface, and an inverted pyramid structure surrounded by (1-1-1),(-1-11),(1-11),(-1-1-1)and (211) crystal faces is demonstrated in the film of the defect. The swallow-tailed defect is (552)A twin defect, the difference of growth rate between (552)A twin crystal and (211)A matrix is the root cause of defect formation. The nucleation sites and growth planes of (552)A twin crystal, (-1-11) and (1-11)crystal plane, which determine the morphology and structure of swallow-tailed defect, depend on different Schmid factor of 12 slip systems in HgCdTe.
keywords:HgCdTe  defect  twin crystal  polar surface  Schmid factor
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Copyright:《Journal of Infrared And Millimeter Waves》