Circular single-photon avalanche diode withhigh premature edge breakdown and extended spectrum
Received:December 06, 2018  Revised:May 24, 2019  download
Citation:
Hits: 158
Download times: 119
Author NameAffiliationE-mail
JIN Xiang-Liang School of Physics and Optoelectronics, Xiangtan University, Xiangtan 411105China
School of Physics and Electronics, Hunan Normal University, Changsha 410081China 
jinxl@xtu.edu.cn 
ZENG Duo-Duo School of Physics and Optoelectronics, Xiangtan University, Xiangtan 411105China  
PENG Ya-Nan School of Physics and Optoelectronics, Xiangtan University, Xiangtan 411105China  
YANG Hong-Jiao School of Physics and Optoelectronics, Xiangtan University, Xiangtan 411105China  
PU Hua-Yan School of Mechatronic Engineering and AutomationShanghai University, Shanghai 200444 China  
PENG Yan School of Mechatronic Engineering and AutomationShanghai University, Shanghai 200444 China  
LUO Jun School of Mechatronic Engineering and AutomationShanghai University, Shanghai 200444 China  
Abstract:This paper presents a 0.18 μm complementary metal-oxide-semiconductor (CMOS) technology high premature edge breakdown, extended spectrum and low dark count rate circular single-photon avalanche diode (SPAD) which together form a novel wide spectrum fluorescence correlation spectroscopy (FCS) detector. The circular device consists of a p+/deep n-well junction, a p-well guard-ring, and a poly guard-ring. Simulations on a Silvaco TCAD 3D device also show that the 10 μm-diameter circular p+/deep n-well SPAD device has high premature edge breakdown characteristics. Moreover,compared to the SPAD p+/n-well junction, the p+/deep n-well junction has a longer wavelength response and spectral expansion. The device achieves wide spectral sensitivity enabling greater than 40% photon detection probability from 490 to 775 nm wavelength at 0.5 V excess bias. The circular p+/deep n-well SPAD has fine avalanche breakdown is 15.14 V and a low dark count rate of 638 Hz at 25℃.
keywords:single-photon avalanche diode(SPAD)  premature edge breakdown (PEB)  dark count rate(DCR)  spectral expansion
View Full Text  HTML  View/Add Comment  Download reader

Copyright:《Journal of Infrared And Millimeter Waves》