Optical phase transition properties of vanadium dioxide thin film characterized by noise spectra
Received:January 08, 2018  Revised:February 05, 2018  download
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Author NameAffiliationE-mail
SHANG Ya-Xuan State Key Laboratory for Supperlattices and Microstructures,Institute of Semiconductors,Chinese Academy of Sciences yaxuanhd@semi.ac.cn 
LIANG Ji-Ran School of Microelectronics,Tianjin University  
LIU Jian State Key Laboratory for Supperlattices and Microstructures,Institute of Semiconductors,Chinese Academy of Sciences  
ZHAO Yi-Rui School of Microelectronics,Tianjin University  
JI Yang State Key Laboratory for Supperlattices and Microstructures,Institute of Semiconductors,Chinese Academy of Sciences jiyang@semi.ac.cn 
Abstract:The reflectance of thermochromatic material vanadium dioxide (VO2) and its fluctuation (noise spectrum) were measured simultaneously during the semiconductor-metal phase transition via self-built experimental system. The noise spectra were measured by a Data-Acquisition Card with real time fast Fourier transforms (FFTs-DAC) , showing the same phase-transition temperature (55 ℃) of the sample as that measured via reflectance measurement. A significant noise peak (around 15-20 MHz) was found in high temperature regime (the metal phase), while being almost flat in low temperature regime (the semiconductor phase). Such a noise peak also reflects that the low-temperature semiconductor phase and the high-temperature metallic phase have different crystal structures. Noise spectroscopy may be widely used to study phase-transtion materials.
keywords:vanadium dioxide thin film  simultaneous measurement  reflectance  noise spectrum  semiconductor-metal transition
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