Research on highly sensitive infrared imaging detection technology based on linear avalanche device
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Affiliation:

1.Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai 200083, China;2.University of Chinese Academy of Sciences, Beijing 100049, China;3.Key Laboratory of Intelligent Infrared Sensing, Chinese Academy of Sciences, Shanghai 200083, China

Clc Number:

TP732.2;TP399

Fund Project:

Supported by Key project of Chinese Academy of Sciences (KGFZD-145-23-04) ; Shanghai Pu Jiang Program (23PJ1414800)

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    Abstract:

    With the development of remote sensing technology, the detection sensitivity of infrared system is increasingly required. The infrared imaging detection technology based on linear avalanche device can effectively improve the detection sensitivity in high frame frequency applications. Based on the short-wave infrared linear avalanche detector assembly of 512×512, a small-aperture and lightweight infrared imaging system is designed and its performance is tested under low reverse bias. The test results show that the increase of SNR of the imaging system based on the linear avalanche infrared detector is basically linear with the multiplication factor M under short integration time, and the SNR of the system is 3 times that of the traditional camera of the same caliber.

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LIN Chang-Qing, ZHOU Shuang-Xi, LI Lu-Fang, LIU Gao-Rui, SUN Hai-Bin, ZHANG Yu, LIN Jia-Mu, SUN Sheng-Li. Research on highly sensitive infrared imaging detection technology based on linear avalanche device[J]. Journal of Infrared and Millimeter Waves,2025,44(1):35~44

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History
  • Received:April 18,2024
  • Revised:November 13,2024
  • Adopted:June 07,2024
  • Online: November 09,2024
  • Published:
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