High Polarization Extinction Ratio Achieved base on thin-film lithium niobate
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1.University of Chinese Academy of Sciences, Beijing 100049, China;2.State Key Laboratory on Integrated Optoelectronics, Institute of Semiconductors, Chinese Academy of Sciences, Beijing 100083, China;3.Beijing Huairou Instruments and Sensors Co, Ltd, Beijing 101400, China

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Supported by Beijing Natural Science Foundation (424206) and the Youth Innovation Promotion Association, CAS (2021108).

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    Abstract:

    This article introduces a method of achieving high polarization extinction ratio using a subwavelength grating structure on a lithium niobate thin film platform, and the chip is formed on the surface of the lithium niobate thin film. The chip, with a length of just 20 micrometers, achieved a measured polarization extinction ratio of 29dB at 1550nm wavelength. This progress not only proves the possibility of achieving a high extinction ratio on a lithium niobate thin film platform, but also offers important technical references for future work on polarization beam splitters, integrated fiber optic gyroscopes, and beyond.

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History
  • Received:March 22,2024
  • Revised:July 20,2024
  • Adopted:May 13,2024
  • Online: July 15,2024
  • Published:
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