A method to evaluate the thermal resistance of a laser by wavelength hysteresis

doi:10.11972/j.issn.1001-9014.2023.03.013

Home > Archive>Volume 42, Issue 3, 2023 >377-382. DOI:10.11972/j.issn.1001-9014.2023.03.013

A method to evaluate the thermal resistance of a laser by wavelength hysteresis
DOI:
                        10.11972/j.issn.1001-9014.2023.03.013
                    
CSTR:
                        [cstr]
                    
Author:
                        
                        
                    
Affiliation:1.State Key Laboratory of Integrated Optoelectronics， Institute of Semiconductors， Chinese Academy of Sciences， Beijing 100083， China;2.Center of Materials Science and Optoelectronics Engineering， University of Chinese Academy of Sciences， Beijing 100049， China;3.State Key Lab of Functional Materials for Informatics， Shanghai Institute of Microsystem and Information Technology (SIMIT)， Chinese Academy of Sciences ， Shanghai 200050， China;4.CAS Center for Excellence in Superconducting Electronics (CENSE)， Shanghai 200050， China
Clc Number:O514.2;O433;O4-34;O551.1;O47
Fund Project:Projects were supported by the National Natural Science Foundation of China （ 61875252， 92165202）， the Strategic Priority Research Program （A） of Chinese Academy of Sciences （XDA18040300）.

Article

Figures

Metrics

Reference

Cited by

Materials

Comments

Abstract:

Packaging is one of the key technologies of optoelectronic devices. It also determines the performance of the packaged device. In the article， a method based on wavelength hysteresis is proposed to evaluate the thermal resistance of the laser at ambient temperatures from 298 K to 10 K. The thermal resistance is characterized by calculating the value of wavelength hysteresis during the cooling and heating process. This method solves the problem that the heat dissipation performance of the laser cannot be evaluated at low temperatures. This is of great significance to the optical interconnection at low temperatures. It also provides a reference for the package design of lasers in a low-temperature environment.

Reference

Cited by

Get Citation

REN Jie, ZHEN Zhen, JIN Si-Yue, HAN Hai-Long, YUAN Pu-Sheng, LI Ling-Yun, YOU Li-Xing, WANG Zhen, XU Xing-Sheng. A method to evaluate the thermal resistance of a laser by wavelength hysteresis[J]. Journal of Infrared and Millimeter Waves,2023,42(3):377~382

Copy

Article Metrics

Abstract:
PDF:
HTML:
Cited by:

History

Received:October 29,2022
Revised:April 01,2023
Adopted:February 02,2023
Online: March 30,2023
Published:

Home

Introduction

Editorial Board

Authors' Guidelines

Open Access

Publishing Ethics

Downloads

Copyright

Contact Us

中文版

Get Citation

Share

Article Metrics

History

Article QR Code