Study on HgCdTe APD focal plane technology
DOI:
Author:
Affiliation:

1.Kunming Institute of Physics;2.Huazhong University of Science and Technology

Clc Number:

TN215

Fund Project:

  • Article
  • |
  • Figures
  • |
  • Metrics
  • |
  • Reference
  • |
  • Related
  • |
  • Cited by
  • |
  • Materials
  • |
  • Comments
    Abstract:

    A 256×256 HgCdTe APD hybrid focal plane array (FPA) with 30μm pixel pitch was prepared by B ion implantation n-on-p planar junction technology based on MW HgCdTe material grown by LPE. The performance parameters such as gain, dark current and noise factor were characterized and analyzed at liquid nitrogen temperature. The results show that the average gain of HgCdTe APD focal plane chip is 166.8 and the gain non-uniformity is 3.33% under - 8.5V reverse bias; Under 0 ~ - 8.5V reverse bias, the gain normalized dark current of APD device is 9.0×10-14A~1.6×10-13A, the noise factor F is between 1.0 and 1.5. In addition, the imaging demonstration of HgCdTe APD focal plane is carried out, and a good imaging effect is obtained.

    Reference
    Related
    Cited by
Get Citation
Share
Article Metrics
  • Abstract:
  • PDF:
  • HTML:
  • Cited by:
History
  • Received:March 01,2022
  • Revised:April 03,2022
  • Adopted:April 14,2022
  • Online:
  • Published: