A distributed small signal equivalent circuit modeling method for InP HEMT
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Affiliation:

1.School of Microelectronics, Xidian University, Key Laboratory of Wide Band-Gap;Semiconductor Materials and Devices, Xi’an 710071, China;2.ZTE Corporation, Shenzhen 518057, China

Clc Number:

TN386

Fund Project:

Supported by the Project InP High Electron Mobility Transistor Noise Model Research and Technical Support in Cooperation with ZTE and the Key Research and Development Program of Shaanxi (2021GY-010)

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    Abstract:

    A distributed small signal equivalent circuit modeling method for InP high electron mobility transistor (HEMT) was presented. The distributed capacitance effect was considered in the adopted model, which is characterized by adding three distributed capacitances. For accurate modeling, the parasitic inductances are extracted first,considerig the errors introduced by the parasitic inductances when extracting the parasitic capacitance first. The validity of the proposed small signal modeling method has been verified with excellent agreement between the measured and modeled results up to 50 GHz for InP HEMT. In addition, the S-parameters’ modeling error is less than 4% in 2 ~ 50 GHz, which also proves the high accuracy of the proposed modeling method.

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QI Jun-Jun, LYU Hong-Liang, CHENG Lin, ZHANG Yu-Ming, ZHANG Yi-Men, ZHAO Feng-Guo, DUAN Lan-Yan. A distributed small signal equivalent circuit modeling method for InP HEMT[J]. Journal of Infrared and Millimeter Waves,2022,41(2):511~516

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History
  • Received:May 24,2021
  • Revised:March 31,2022
  • Adopted:September 23,2021
  • Online: March 31,2022
  • Published:
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