1.Jilin University, College of Instrumentation & Electrical Engineering, Changchun 130061, China;2.Chongqing Institute of Green and Intelligent Technology, Chinese Academy of Sciences, Chongqing 400714, China
TH744
Supported by the Natural Science Foundation of Shandong Province (ZR2020KF007)
WANG Jie, TAN Bing-Chong, TAO Xing-Zhu, XU Cheng-Cheng, CHANG Tian-Ying, CUI Hong-Liang, ZHANG Jin. Terahertz detection of thin defects thickness based on Hilbert transform and power spectrum estimation[J]. Journal of Infrared and Millimeter Waves,2022,41(3):589~596
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