The ‘swallow-tailed defect’ in MBE HgCdTe film

doi:10.11972/j.issn.1001-9014.2020.06.005

Home > Archive>Volume 39, Issue 6, 2020 >690-695. DOI:10.11972/j.issn.1001-9014.2020.06.005

The ‘swallow-tailed defect’ in MBE HgCdTe film
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                        10.11972/j.issn.1001-9014.2020.06.005
                    
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                        YANG JinYANG Jin
Kunming Institute of Physics， Kunming 650223， China
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KONG Jin-ChengKONG Jin-Cheng
Kunming Institute of Physics， Kunming 650223， China
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YU Jian-YunYU Jian-Yun
Kunming Institute of Physics， Kunming 650223， China
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LI Yan-HuiLI Yan-Hui
Kunming Institute of Physics， Kunming 650223， China
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YANG Chun-ZhangYANG Chun-Zhang
Kunming Institute of Physics， Kunming 650223， China
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QIN GangQIN Gang
Kunming Institute of Physics， Kunming 650223， China
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LI Dong-ShengLI Dong-Sheng
Kunming Institute of Physics， Kunming 650223， China
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LEI WenLEI Wen
Kunming Institute of Physics， Kunming 650223， China
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ZHAO JunZHAO Jun
Kunming Institute of Physics， Kunming 650223， China
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JI Rong-BinJI Rong-Bin
Kunming Institute of Physics， Kunming 650223， China
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Affiliation:Kunming Institute of Physics， Kunming 650223， China
Clc Number:TN304
Fund Project:Supported by the National Science and Technology Major Project of the Ministry of Science and Technology of China.

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Abstract:

The swallow-tailed defect is a typical defect in MBE HgCdTe which has a uniform and regular shape. The morphology， structure and growth mechanism of swallow-tailed defect were investigated. Two raised swallow-tails are major characteristic on the surface， and an inverted pyramid structure surrounded by （1-1-1），（-1-11），（1-11），（-1-1-1）and （211） crystal faces is demonstrated in the film of the defect. The swallow-tailed defect is （552）A twin defect， the difference of growth rate between （552）A twin crystal and （211）A matrix is the root cause of defect formation. The nucleation sites and growth planes of （552）A twin crystal，（-1-11） and （1-11）crystal plane， which determine the morphology and structure of swallow-tailed defect， depend on different Schmid factor of 12 slip systems in HgCdTe.

Key words:HgCdTe;defect;twin crystal;polar surface;Schmid factor

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YANG Jin, KONG Jin-Cheng, YU Jian-Yun, LI Yan-Hui, YANG Chun-Zhang, QIN Gang, LI Dong-Sheng, LEI Wen, ZHAO Jun, JI Rong-Bin. The ‘swallow-tailed defect’ in MBE HgCdTe film[J]. Journal of Infrared and Millimeter Waves,2020,39(6):690~695

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Received:March 12,2020
Revised:November 22,2020
Adopted:April 21,2020
Online: November 20,2020
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