CHARACTERISTICS OF PSD233 POSITION SENSITIVE DETECTOR AND ITS APPLICATION IN ATOMIC FORCE MICROSCOPE

Home > Archive>Volume 22, Issue 5, 2003 >384-388

CHARACTERISTICS OF PSD233 POSITION SENSITIVE DETECTOR AND ITS APPLICATION IN ATOMIC FORCE MICROSCOPE
DOI:
                        
CSTR:
                        [cstr]
                    
Author:
                        
Affiliation:
Clc Number:TN15
Fund Project:

Article

Figures

Metrics

Reference

Cited by

Materials

Comments

Abstract:

Reference

Cited by

Get Citation

ZHANG Dong Xian ZHANG Hai Jun LIN Xiao Feng. CHARACTERISTICS OF PSD233 POSITION SENSITIVE DETECTOR AND ITS APPLICATION IN ATOMIC FORCE MICROSCOPE[J]. Journal of Infrared and Millimeter Waves,2003,22(5):384~388

Copy

Article Metrics

Abstract:
PDF:
HTML:
Cited by:

History

Received:
Revised:November 06,2002
Adopted:
Online:
Published:

Home

Introduction

Editorial Board

Authors' Guidelines

Open Access

Publishing Ethics

Downloads

Copyright

Contact Us

中文版

Get Citation

Share

Article Metrics

History

Article QR Code