SPATIAL RESOLUTION OF ELECTROOPTIC SAMPLING WITH BACK-DIRECT SAMPLING STRUCTURE
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TN15 TN407

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    Abstract:

    介绍了电光取样系统空间分辨率的测量原理和方法,实验结果表明,建立的电光取样仪的空间分辨率为3μm。

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JIA Gang CHEN Zhan Guo CAO Jie YI Mao Bin SUN Wei GAO Ding San. SPATIAL RESOLUTION OF ELECTROOPTIC SAMPLING WITH BACK-DIRECT SAMPLING STRUCTURE[J]. Journal of Infrared and Millimeter Waves,2001,20(2):123~125

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  • Received:
  • Revised:January 11,2000
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