Microstructures of single layer of telluride and telluride/ZnS multilayer on Si and Ge substrates were investigated by XRD and TEM. The correlation between adhesion and microstructure of layers was given.
ZHANG Su-Ying, FAN Bin, CHENG Shi-Ping, LIN Jie-Hua, ZHOU Shi-Yao, WANG Ge-Ya, SHI Tian-Shen. DEPENDENCE OF ADHESION OF FILMS OF TELLURIDE UPON ITS MI CROSTRUCTURE[J]. Journal of Infrared and Millimeter Waves,1999,18(4):327~331Copy