THE MAGNETORESISTANCE PROPERTIES OF HgCdTe PHOTOCONDUCTIVE DETECTORS
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Abstract:
The magnetoresistance of three HgCdTe photoconductive detectors and one liquid phase epitaxially grown HgCdTe film was measured. The fitting results analyzed by a two carrier model of reduced conductivity tensor (RCT) scheme agree well with the experimental data.
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Gui Yongsheng Chu Junhao Zheng Guozhen Guo Shaoling Tang Dingyuan. THE MAGNETORESISTANCE PROPERTIES OF HgCdTe PHOTOCONDUCTIVE DETECTORS[J]. Journal of Infrared and Millimeter Waves,1997,16(4):256~260