STUDY OF MINORITY CARRIER LIFETIME IN SEMICONDUCTORS BY CONTACTLESS MEASUREMENT METHOD:MICROWAVE REFLECTANCE TECHNIQUE
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TN303 TN304.26
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Abstract:
A contactless method of microwave reflectance (MR) measurement for the minority carrier lifetime in semiconductors was introduced and compared with the photoconduction decay (PCD) measurement method.
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Wang Zhengqiu Gong Haimei Li Yanjin Zhou Baoqing Fang Jiaxiong. STUDY OF MINORITY CARRIER LIFETIME IN SEMICONDUCTORS BY CONTACTLESS MEASUREMENT METHOD:MICROWAVE REFLECTANCE TECHNIQUE[J]. Journal of Infrared and Millimeter Waves,1996,15(1):77~80