Wang Zhengqiu Gong Haimei Li Yanjin Zhou Baoqing Fang Jiaxiong
TN303 TN304.26
A contactless method of microwave reflectance (MR) measurement for the minority carrier lifetime in semiconductors was introduced and compared with the photoconduction decay (PCD) measurement method.
Wang Zhengqiu Gong Haimei Li Yanjin Zhou Baoqing Fang Jiaxiong. STUDY OF MINORITY CARRIER LIFETIME IN SEMICONDUCTORS BY CONTACTLESS MEASUREMENT METHOD:MICROWAVE REFLECTANCE TECHNIQUE[J]. Journal of Infrared and Millimeter Waves,1996,15(1):77~80
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