INVESTIGATION OF FREE EXCITONS IN UNDOPED MOCVD GaAs EPITAXIAL LAYER OF DIFFERENT THICKNESSES BY PHOTOCONDUCTIVITY
DOI:
CSTR:
Author:
Affiliation:

Clc Number:

O471.3

Fund Project:

  • Article
  • |
  • Figures
  • |
  • Metrics
  • |
  • Reference
  • |
  • Related
  • |
  • Cited by
  • |
  • Materials
  • |
  • Comments
    Abstract:

    he properties of the free-exciton transitions in undoped MOCVD GaAs epitaxial layer of thicknesses varying from 4 to 30 Urn were determined by using the photoconductivity measurements.It was found that as the thickness is increased,the binding energy R.increases,and the free exciton peak for n=1 shifts slightly towards lower energies,but both the intensity of the higher excitonic levels and the lifetime T of the excitons decrease.These effects were attributed mainly to the defects and electrical field near the surface of the epilayer.Finally,the photoluminescence results and the influence of the measurement temperature on them were also discussed.

    Reference
    Related
    Cited by
Get Citation

Wu Fengmei, Shi Yi. INVESTIGATION OF FREE EXCITONS IN UNDOPED MOCVD GaAs EPITAXIAL LAYER OF DIFFERENT THICKNESSES BY PHOTOCONDUCTIVITY[J]. Journal of Infrared and Millimeter Waves,1995,14(4):263~270

Copy
Share
Article Metrics
  • Abstract:
  • PDF:
  • HTML:
  • Cited by:
History
  • Received:
  • Revised:
  • Adopted:
  • Online:
  • Published:
Article QR Code