THE PARTIAL-INTERFERENCED MODEL CALCULATION OF THE SPECTROSCOPY FOR THE MULTI-QUANTUM WELLS

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THE PARTIAL-INTERFERENCED MODEL CALCULATION OF THE SPECTROSCOPY FOR THE MULTI-QUANTUM WELLS
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                        Ma Zhaohui Lu Wei Liu Xingquan Mao Huibing Qiu Yueming Shen XuechuMa Zhaohui Lu Wei Liu Xingquan Mao Huibing Qiu Yueming Shen Xuechu

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Clc Number:O436.1 O484.41
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Abstract:

The model calculation of the reflection spectroscopy for the multi-layer film system is discussed in detail. Considering the effect of interference length on the film system and the substrate, a simple and useful method to calculate the reflection spectroscopy is presented, and the predominance of this method can be seen from the calculation for the experimental spectroscopy.

Key words:multi-layer film, spectroscopy, interference length.,

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Ma Zhaohui Lu Wei Liu Xingquan Mao Huibing Qiu Yueming Shen Xuechu. THE PARTIAL-INTERFERENCED MODEL CALCULATION OF THE SPECTROSCOPY FOR THE MULTI-QUANTUM WELLS[J]. Journal of Infrared and Millimeter Waves,1994,13(5):328~332

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