STRUCTURE DETERMINATION OF INFRARED MATERIAL OF (CdTe-ZnTe)/ZnTe/GaAs (001) SUPERLATTICE BY X-RAY DIFFRACTION
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Abstract:
The structure perfection of infrared materials of (CdTes-ZnTe)/ZnTe superlattices grown on GaAs (001) by atomic layer epitaxy was investigated by X-ray diffraction (XRD), combined with the analysis of kinematical X-ray diffraction theory and computer simulation of dynamical X-ray diffraction theory. The structure parameters were obtained for the simple and the complex structures of superlattices.
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Zhong Fuming, Chen Jinyi, Zhu Nanchang. STRUCTURE DETERMINATION OF INFRARED MATERIAL OF (CdTe-ZnTe)/ZnTe/GaAs (001) SUPERLATTICE BY X-RAY DIFFRACTION[J]. Journal of Infrared and Millimeter Waves,1994,13(1):