Orthogonal design of multilayer thin film residual stress impact on the THz micro bridge deformation
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University of Electronic Science and Technology of China,University of Electronic Science and Technology of China

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    Abstract:

    Residual stress matching is critical for elimination of deformation for terahertz (THz) microbolometer with micro-bridge structure. Finite element simulation model of micro-bridge was built with a pixel size of 35 μm×35 μm. Intellisuite was used for mechanics simulation based on orthogonal experimental design. A minimum deformation of 0.0385 μm was obtained with an optimized stress combination when the residual stresses of support layer, passivation layer, electrode layer, sensitive layer and absorption layer were +200 MPa, +200 MPa, +200 MPa, 0 MPa and -400 MPa, respectively. 320×240 THz focal plane array was fabricated with the optimized stress combination. A minimal deformation was achieved, which agreed well with the simulation.

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ZHENG Xing, LIU Zi-Ji, GU De-En, GOU Jun, MA Jia-Feng, LI Wei-Zhi, WU Zhi-Ming. Orthogonal design of multilayer thin film residual stress impact on the THz micro bridge deformation[J]. Journal of Infrared and Millimeter Waves,2016,35(3):326~331

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History
  • Received:August 14,2015
  • Revised:September 24,2015
  • Adopted:October 08,2015
  • Online: July 28,2016
  • Published: July 28,2016
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