Shanghai Engineering Research Center of Ultra-Precision Optical Manufacturing and Department of Optical Science and Engineering,Fudan University,Shanghai,Shanghai Engineering Research Center of Ultra-Precision Optical Manufacturing and Department of Optical Science and Engineering,Fudan University,Shanghai,Shanghai Engineering Research Center of Ultra-Precision Optical Manufacturing and Department of Optical Science and Engineering,Fudan University,Shanghai,Shanghai Engineering Research Center of Ultra-Precision Optical Manufacturing and Department of Optical Science and Engineering,Fudan University,Shanghai,Shanghai Engineering Research Center of Ultra-Precision Optical Manufacturing and Department of Optical Science and Engineering,Fudan University,Shanghai,Shanghai Engineering Research Center of Ultra-Precision Optical Manufacturing and Department of Optical Science and Engineering,Fudan University,Shanghai,Key Laboratory of Infrared Image Materials and Devices, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai 200083, China,Key Laboratory of Infrared Image Materials and Devices, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai 200083, China,Key Laboratory of Infrared Image Materials and Devices, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai 200083, China
WANG Zi-Yi, ZHANG Rong-Jun, TANG Bin, SUN Yuan-Cheng, XU Ji-Ping, ZHENG Yu-Xiang, WANG Song-You, CHEN Liang-Yao, FAN Hua, LIAO Qing-Jun, WEI Yan-Feng. Uniqueness test for thin film fitting in spectroscopic ellipsometry[J]. Journal of Infrared and Millimeter Waves,2015,34(6):663~667
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