WEI Lai-Ming
National Laboratory for Infrared Physics,Shanghai Institute of Technical Physics,Chinese Academy of ScienceLIU Xin-Zhi
National Laboratory for Infrared Physics,Shanghai Institute of Technical Physics,Chinese Academy of ScienceYU Guo-Lin
National Laboratory for Infrared Physics,Shanghai Institute of Technical Physics,Chinese Academy of ScienceGAO Kuang-Hong
Key Laboratory of Polar Materials and Devices of Ministry of Education,School of Science and Technology of Information,East China Normal UniversityWANG Qi-Wei
National Laboratory for Infrared Physics,Shanghai Institute of Technical Physics,Chinese Academy of ScienceLIN Tie
National Laboratory for Infrared Physics,Shanghai Institute of Technical Physics,Chinese Academy of ScienceGUO Shao-Ling
National Laboratory for Infrared Physics,Shanghai Institute of Technical Physics,Chinese Academy of ScienceWEI Yan-Feng
Key Laboratory of Infrared Imaging Materials and Detectors,Shanghai Institute of Technical Physics,Chinese Academy of ScienceYANG Jian-Rong
Key Laboratory of Infrared Imaging Materials and Detectors,Shanghai Institute of Technical Physics,Chinese Academy of ScienceHE Li
Key Laboratory of Infrared Imaging Materials and Detectors,Shanghai Institute of Technical Physics,Chinese Academy of ScienceDAI Ning
National Laboratory for Infrared Physics,Shanghai Institute of Technical Physics,Chinese Academy of ScienceCHU Jun-Hao
National Laboratory for Infrared Physics,Shanghai Institute of Technical Physics,Chinese Academy of ScienceNational Laboratory for Infrared Physics,Shanghai Institute of Technical Physics,Chinese Academy of Science,National Laboratory for Infrared Physics,Shanghai Institute of Technical Physics,Chinese Academy of Science,National Laboratory for Infrared Physics,Shanghai Institute of Technical Physics,Chinese Academy of Science,Key Laboratory of Polar Materials and Devices of Ministry of Education,School of Science and Technology of Information,East China Normal University,National Laboratory for Infrared Physics,Shanghai Institute of Technical Physics,Chinese Academy of Science,National Laboratory for Infrared Physics,Shanghai Institute of Technical Physics,Chinese Academy of Science,National Laboratory for Infrared Physics,Shanghai Institute of Technical Physics,Chinese Academy of Science,Key Laboratory of Infrared Imaging Materials and Detectors,Shanghai Institute of Technical Physics,Chinese Academy of Science,Key Laboratory of Infrared Imaging Materials and Detectors,Shanghai Institute of Technical Physics,Chinese Academy of Science,Key Laboratory of Infrared Imaging Materials and Detectors,Shanghai Institute of Technical Physics,Chinese Academy of Science,National Laboratory for Infrared Physics,Shanghai Institute of Technical Physics,Chinese Academy of Science,National Laboratory for Infrared Physics,Shanghai Institute of Technical Physics,Chinese Academy of Science
WEI Lai-Ming, LIU Xin-Zhi, YU Guo-Lin, GAO Kuang-Hong, WANG Qi-Wei, LIN Tie, GUO Shao-Ling, WEI Yan-Feng, YANG Jian-Rong, HE Li, DAI Ning, CHU Jun-Hao. Antilocalization effect in HgCdTe film[J]. Journal of Infrared and Millimeter Waves,2013,32(2):141~144
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