Microstructures and optical properties of relaxor ferroelectric 0.74Pb (Mg1/3Nb2/3)O3-0.26PbTiO3 thin films
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Key Laboratory of Optoelectronic Material and Device,Shanghai Normal University,Key Laboratory of Optoelectronic Material and Device,Shanghai Normal University,Key Laboratory of Optoelectronic Material and Device,Shanghai Normal University,Key Laboratory of Optoelectronic Material and Device,Shanghai Normal University,Key Laboratory of Optoelectronic Material and Device,Shanghai Normal University,Key Laboratory of Optoelectronic Material and Device,Shanghai Normal University,Key Laboratory of Optoelectronic Material and Device,Shanghai Normal University,Key Laboratory of Optoelectronic Material and Device,Shanghai Normal University,Key Laboratory of Optoelectronic Material and Device,Shanghai Normal University,Key Laboratory of Optoelectronic Material and Device,Shanghai Normal University,Key Laboratory of Optoelectronic Material and Device,Shanghai Normal University,National Laboratory for Infrared Physics,Shanghai Institute of Technical Physics,Chinese Academy of Sciences,College of Physics Science,Qingdao University

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    Abstract:

    Relaxor ferroelectric 0.74Pb (Mg1/3Nb2/3)O3-0.26PbTiO3thin films were prepared on LaNiO3-buffered silicon substrates by radio-frequency magnetron sputtering. The effect of deposition temperature on films" microstructures and optical properties was investigated. The sample deposited at 500℃ exhibits not only a pure perovskite phase, highly (110)-preferred orientation, and dense and crack-free morphology, but also the largest average remnant polarization of 17.2 μC/cm2 among all investigated films. With Cauchy model the refractive indices and extinction coefficients for these specimens have been obtained by fitting experimental reflectance spectra. At a wavelength of 633 nm, the value of refractive index is 2.41 was obtained for the thin films deposited at 500 ℃. In addition, optical band gaps of the films are in the range of 2.97–3.22 eV. A preliminary discussion has been carried out on the difference in the optical properties of these films.

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TIAN Yue, TANG Yan-Xue, ZHOU Dan, HU Zhi-Juan, WANG Fei-Fei, CHEN Xin-Man, LIU Feng, WANG Tao, XIE Dong-Zhu, SUN Da-Zhi, SHI Wang-Zhou, HU Gu-Jin, KONG Wei- Jin. Microstructures and optical properties of relaxor ferroelectric 0.74Pb (Mg1/3Nb2/3)O3-0.26PbTiO3 thin films[J]. Journal of Infrared and Millimeter Waves,2012,31(4):289~293

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History
  • Received:April 30,2011
  • Revised:March 10,2012
  • Adopted:May 31,2011
  • Online: August 27,2012
  • Published: