基于可控衬底偏角调节SESAM缺陷:恢复动力学与光学性能优化
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1.中国科学院半导体研究所 光电子器件国家工程研究中心;2.广东华快光子技术有限公司;3.湖南警察学院;4.中国科学院大学 材料科学与光电工程学院;5.北京大学 信息科学技术学院

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国家重点研发计划


Defect-Engineered SESAMs via controlled substrate miscut angles: recovery dynamics and optical performance optimization
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1.National Engineering Research Center for Optoelectronic Devices, Institute of Semiconductors;2.Guangdong Huakai Photon Technology Co.;3.Hunan Police Academy;4.College of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences;5.College of Information Science and Technology, Peking University

Fund Project:

National Key Research and Development Program of China (No. 2022YFB3606200 )

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    摘要:

    半导体可饱和吸收镜(SESAM)是实现超快光纤激光器的关键器件,但其性能常受载流子恢复时间缓慢的限制。本研究探讨了衬底偏角([110]偏向0°、2°和6°)对金属有机化学气相沉积(MOCVD)在(100)GaAs衬底上生长的InGaAs/GaAsP SESAM的性能及锁模特性的影响。通过高分辨率X射线衍射(HRXRD)、原子力显微镜(AFM)、光致发光光谱(PL)和分光光度计进行综合表征发现,增大偏角会引入晶格缺陷,从而显著缩短恢复时间。然而,较大的偏角也会增加表面粗糙度和非饱和损耗,导致非线性吸收性能下降。在掺镱光纤激光器测试中,具有2°偏角的SESAM实现了稳定锁模,生成了1064 nm波长下8.2 ps的脉冲;而6°偏角的器件因材料质量下降表现出性能劣化。该研究为通过衬底偏角优化SESAM提供了重要见解,并为设计高性能超快激光器提供了实用指导。

    Abstract:

    Semiconductor saturable absorber mirrors (SESAMs) are vital for enabling ultrafast fiber lasers, yet their performance is often constrained by slow carrier recovery times. This study investigates the influence of substrate miscut angle (0°, 2°, and 6° toward the [110] direction) on the properties and mode-locking performance of InGaAs/GaAsP SESAMs grown by metal-organic chemical vapor deposition (MOCVD) on (100) GaAs substrates. Comprehensive characterization via high-resolution X-ray diffraction (HRXRD), atomic force microscopy (AFM), photoluminescence (PL) spectroscopy , and spectrophotometry reveals that increasing the miscut angle introduces lattice defects, significantly reducing recovery time. However, larger miscut angles also increase surface roughness and nonsaturable losses, degrading nonlinear absorption. In Yb-doped fiber laser tests, SESAMs with 2°-miscut angles achieved stable mode-locking, generating 8.2 ps pulses at 1064 nm, while 6°-miscut devices exhibited deteriorated performance due to material quality degradation. This work provides critical insights into optimizing SESAMs via substrate engineering and offers practical guidelines for designing high-performance ultrafast lasers.

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  • 收稿日期:2025-09-02
  • 最后修改日期:2025-10-30
  • 录用日期:2025-10-31
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