Ka波段相控阵雷达TR组件幅相控制芯片的大功率微波非线性效应研究
投稿时间:2018-08-11  修订日期:2018-11-19  点此下载全文
引用本文:郭彍,许雄,魏彦玉,郭长永.Ka波段相控阵雷达TR组件幅相控制芯片的大功率微波非线性效应研究[J].红外与毫米波学报,2019,38(5):572~577].GUO Guo,XU Xiong,WEI Yan-Yu,GUO Chang-Yong.Investigation of large power microwave nonlinear effects on amplitude-phase controller chip for Ka-band phased array radar T/R modules[J].J.Infrared Millim.Waves,2019,38(5):572~577.]
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作者单位邮编
郭彍 电子科学与工程学院电子科技大学 610054
许雄 电子信息系统复杂电磁环境效应国家重点实验室 
魏彦玉 电子科学与工程学院电子科技大学 
郭长永 南阳技师学院 
中文摘要:采用实验测试和理论分析的方法研究了幅相控制芯片的大功率微波非线性效应。该芯片应用于Ka波段相控阵雷达收发组件中。测试平台利用固态源和脉冲磁控管来产生Ka波段大功率微波。随着输入功率幅值的提高,在实验中很明显地观测到了芯片的降级和毁伤现象。通过一系列的实验测试得到了芯片的全态相移特性和降级阈值,并通过图片给出了实验结果。最后,通过理论分析给出了该芯片的毁伤机理。
中文关键词:无线电物理学  非线性效应  实验测试  幅相控制芯片  T/R组件  大功率微波
 
Investigation of large power microwave nonlinear effects on amplitude-phase controller chip for Ka-band phased array radar T/R modules
Abstract:Large power microwave nonlinear effects on amplitude-phase controller chip were experimentally tested and theoretical analyzed. This chip had the typical application on Ka-band phased array radar (PAR) transmit/receive (T/R) modules. The test platform was built up by a solid source and a pulsed magnetron to generate large power Ka-band microwave. The degradation and destroy phenomenon were observed distinctly as the input power amplitudes were improved. The total-state phase characteristics and the degradation thresholds of the selected chip are obtained through a series of experimental tests. At last, the results are given by figures and the damage mechanism is theoretically analyzed.
keywords:radio physics  nonlinear effects  experimental test  amplitude-phase controller chip  T/R modules  large power microwave
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