高密度平面型InGaAs焦平面像元耦合作用数学模型
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中国科学院上海技术物理研究所

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国家自然科学基金项目(面上项目,重点项目,重大项目)


Mathematical model of pixel coupling in high-density planar InGaAs focal plane arrays
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The Shanghai Institute of Technical Physics of the Chinese Academy of Sciences

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The National Natural Science Foundation of China (General Program, Key Program, Major Research Plan)

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    摘要:

    InGaAs焦平面探测器的应用追求高密度小中心距,中心距的减小加强了面阵像元间的相互耦合作用。通过制备不同规模5 μm中心距InGaAs小面阵器件,研究高密度焦平面像元耦合作用,创新地引入矩阵方程描述各部分的暗电流贡献,构建像元耦合数学模型,定量分析了耦合作用导致的暗电流贡献。结果表明,在-0.1 V偏压下,面阵中反偏状态像元对邻近反偏状态像元的暗电流抑制程度为像元本底暗电流的21.39%;零偏状态像元对邻近反偏状态像元的暗电流增幅程度可达219.42%。利用高密度焦平面像元耦合模型,总结了像元耦合对暗电流的影响规律,为高密度InGaAs焦平面的暗电流研究提供了新的思路。

    Abstract:

    The application of InGaAs focal plane arrays (FPAs) desires high density and small pixel pitch, and the smaller the pixel pitch, the stronger the pixel coupling. By fabricating 5 μm pitch InGaAs arrays with different scales, the pixel coupling effects in high-density InGaAs arrays were studied. Innovatively, matrix equations were introduced to describe the contributions of dark current from each part, constructing a mathematical model of pixel coupling and the contributions of dark current resulting from coupling effects were quantitatively analyzed. The results indicated that at a bias voltage of -0.1 V, the reverse-biased pixels in the array can suppress the dark current of adjacent reverse-biased pixels by 21.39% of the pixel's initial dark current. In contrast, zero-biased pixels can increase the dark current of adjacent reverse-biased pixels by 219.42%. Based on the high-density focal plane pixel coupling model, the impact rules of pixel coupling on dark current have been summarized, providing new insights for the dark current research in high-density InGaAs focal plane arrays.

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  • 收稿日期:2024-11-14
  • 最后修改日期:2025-01-29
  • 录用日期:2025-02-13
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