双色红外探测器芯片的串音测试方法研究
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TN304.2

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Research on the Crosstalk Test Method of Two-Color Infrared Detector Chips
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    摘要:

    介绍了双色红外探测器对目标识别的重要意义,阐述了常见双色红外探测器的工作原理,并指出了光谱串音测试方法的局限性。结合实际应用中响应电压的重要作用,从普朗克黑体辐射原理出发,对响应电压串音测试方法进行了论证。计算结果表明,举例的双层材料双色探测器的长波波段向中波波段的光谱串音为13.7%,但长波波段向中波波段的响应电压串音为2.3%。通过成像验证,实际应用场景中长波波段向中波波段的串音比例约为2.4%,证明响应电压串音测试方法具有实用性。该方法不仅适用于双层材料的双色红外探测器,也适用于单层材料的拼接式双色红外探测器,对于双色红外探测器芯片发展具有参考意义。

    Abstract:

    This paper introduces the importance of two-color infrared detectors for target identification, explains the operating principles of common two-color infrared detectors, and points out the limitations of spectral crosstalk test methods. Integrating the crucial role of response voltage in practical applications, the response-voltage crosstalk test method is demonstrated based on the principle of Planck blackbody radiation. Calculation results show that the spectral crosstalk from the long-wave band to the mid-wave band for the example two-layer two-color detector is 13.7%, while the response-voltage crosstalk from the long-wave band to the mid-wave band is 2.3%. Imaging verification shows that the crosstalk ratio from the long-wave band to the mid-wave band in actual application scenarios is approximately 2.4%, demonstrating the practicality of the response-voltage crosstalk test method. This method is applicable not only to two-layer two-color infrared detectors but also to single-layer spliced two-color infrared detectors, providing valuable insights into the development of two-color infrared detector chips.

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程雨,于元祯,王亮,等.双色红外探测器芯片的串音测试方法研究[J].红外,2025,46(10):46-51.

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