1Electronic and Information Engineering College, Shenyang Aerospace University, Shenyang 110136, China;2Key Laboratory of Opto-Electronic Information Processing, Chinese Academy of Sciences, Shenyang 110169, China;3Shenyang Institute of Automation, Chinese Academy of Sciences, Shenyang 110169, China;4Key Laboratory of Terahertz Imaging and Sensing, Liaoning Province, Shenyang 110169, China
TN215
Supported by the Liaoning Provincial Youth Science Fund Project Category B( 2025JH6/101000029 ), the National Key R&D Program of China ( 2023YFF0718303 ), the Fundamental Research Project of SIA ( 2024JC1K08 )
