高精细度硅超稳光学参考腔的自主研制
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作者单位:

1中国科学院国家授时中心,西安 710600;2中国科学院时间基准及应用重点实验室,西安710600;3西安超纳精密光学有限公司,西安710100;4西安邮电大学通信与信息工程学院,西安710121

作者简介:

Email: xuguanjun@ntsc.ac.cntaoliu@ntsc.ac.cn

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中图分类号:

043

基金项目:


Independent development of a Silicon ultra-stable optical reference cavity with high-finesse
Author:
Affiliation:

1National Time Service Center, Chinese Academy of Sciences, Xi’an 710600, China;2Key Laboratory of Time Reference and Application, Chinese Academy of Sciences, Xi’an 710600, China;3Xi’an SNP Precision Optics Co., Ltd., Xi’an 710100, China;4School of Communications and Information Engineering and School of Artificial Intelligence, Xi’an University of Posts and Telecommunications, Xi’an 710121, China

Fund Project:

Supported by the National Natural Science Foundation of China (NSFC) (12303076, 12403078), the Key Research and Development Program of Shaanxi Province (2024GX-ZDCYL-01-28), the Sanqin Talents' Special Support Program (09R0557A00), the Shaanxi Provincial Outstanding Young Scientist Fund Project (2025JC-JCQN-082), the Shaanxi Province Key Research and Development Program (2025CY-YBXM-0060), the Shaanxi Province Qin Chuangyuan "Scientist + Engineer" Team Construction Project (2025QCY-KXJ-162), the Open Fund of Hubei Luojia Laboratory (230100030).

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    摘要:

    本工作展示了自主研制高精细度硅超稳光学参考腔。硅材料具有卓越的热稳定性、较低的机械损耗以及优异的振动不敏感度。通过优化加工工艺,有效解决了硅材料脆性和各向异性带来的关键制造挑战。采用三级抛光技术,实现了超光滑表面,粗糙度达到埃级(RMS)。高反射膜采用SiO2/Ta2O5作为涂层材料,通过离子束溅射沉积法制备。通过腔线宽测量的方法显示其精细度约为340,000,与国际顶尖水平相当。这些结果表明中国独立开发高性能硅基超稳光学参考腔的能力。这一进展对光钟和引力波探测等精密应用具有重要意义。

    Abstract:

    This work presents the independent development of a silicon ultra-stable optical reference cavity with high-finesse. Silicon exhibits exceptional thermal stability, lower mechanical loss, and superior vibrational insensitivity. An optimized machining process effectively addresses key manufacturing challenges posed by silicon's brittleness and anisotropic properties. The three-stage polishing technology is utilized to achieve ultra-smooth surfaces with ? level roughness (RMS). The high-reflection film is produced using SiO2/Ta2O5 as the coating material via ion beam sputter deposition. A cavity linewidth measurement method demonstrates a finesse of ~340,000, comparable to top international counterparts. These results demonstrate China’s ability to independently develop high-performance silicon-based ultra-stable optical reference cavities. This advancement holds significance for precision applications like optical clocks and gravitational wave detection.

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历史
  • 收稿日期:2025-06-03
  • 最后修改日期:2025-06-19
  • 录用日期:2025-06-24
  • 在线发布日期: 2026-04-28
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