Near-field imaging of theLaAlO3SrTiO3 interfacial conductivity
Received:February 10, 2017  Revised:April 25, 2017  download
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Author NameAffiliationE-mail
CHENG Long Hefei National Laboratory for Physical Sciences at the Microscale, University of Science and Technology of China dragoncl@mail.ustc.edu.cn 
WANG Dong-Li Hefei National Laboratory for Physical Sciences at the Microscale, University of Science and Technology of China  
DAI Si-Yuan Department of Physics, The University of California at San Diego siyuandai1991@gmail.com 
YAN Yue-Dong Hefei National Laboratory for Physical Sciences at the Microscale, University of Science and Technology of China  
FAN Xiao-Dong Hefei National Laboratory for Physical Sciences at the Microscale, University of Science and Technology of China  
WEI Lai-Ming Hefei National Laboratory for Physical Sciences at the Microscale, University of Science and Technology of China  
ZENG Chang-Gan Hefei National Laboratory for Physical Sciences at the Microscale, University of Science and Technology of China cgzeng@ustc.edu.cn 
Abstract:The LaAlO3/SrTiO3 heterointerface has been discovered to show two-dimensional interfacial conductivity and other intriguing emergent phenomena. Its interfacial conductivity was mainly characterized by electric methods previously. Here the authors present for the first time that scattering-type scanning near-field optical microscopy (s-SNOM) can be employed to spatially image the conductivity of the buried LaAlO3/SrTiO3 interface, providing a new means to study the physics of transition metal oxide heterointerface systems.
keywords:transition metal oxide heterointerface, LaAlO3/SrTiO3, s-SNOM
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Copyright:《Journal of Infrared And Millimeter Waves》