Near-field imaging of theLaAlO3SrTiO3 interfacial conductivity
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Hefei National Laboratory for Physical Sciences at the Microscale, University of Science and Technology of China,Hefei National Laboratory for Physical Sciences at the Microscale, University of Science and Technology of China,Department of Physics, The University of California at San Diego,Hefei National Laboratory for Physical Sciences at the Microscale, University of Science and Technology of China,Hefei National Laboratory for Physical Sciences at the Microscale, University of Science and Technology of China,Hefei National Laboratory for Physical Sciences at the Microscale, University of Science and Technology of China,Hefei National Laboratory for Physical Sciences at the Microscale, University of Science and Technology of China

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    Abstract:

    The LaAlO3/SrTiO3 heterointerface has been discovered to show two-dimensional interfacial conductivity and other intriguing emergent phenomena. Its interfacial conductivity was mainly characterized by electric methods previously. Here the authors present for the first time that scattering-type scanning near-field optical microscopy (s-SNOM) can be employed to spatially image the conductivity of the buried LaAlO3/SrTiO3 interface, providing a new means to study the physics of transition metal oxide heterointerface systems.

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CHENG Long, WANG Dong-Li, DAI Si-Yuan, YAN Yue-Dong, FAN Xiao-Dong, WEI Lai-Ming, ZENG Chang-Gan. Near-field imaging of theLaAlO3SrTiO3 interfacial conductivity[J]. Journal of Infrared and Millimeter Waves,2017,36(5):534~538

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History
  • Received:February 10,2017
  • Revised:April 25,2017
  • Adopted:April 27,2017
  • Online: November 29,2017
  • Published: