面阵探测器相连缺陷元识别定位研究
Received:July 01, 2016  Revised:October 11, 2016  点此下载全文
引用本文:侯治锦,傅 莉,司俊杰,王 巍,吕衍秋,鲁正雄,王锦春.面阵探测器相连缺陷元识别定位研究[J].Journal of Infrared and Millimeter Waves,2017,36(2):208~213
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Author NameAffiliationE-mail
HOU Zhi-Jin China Airbome Missile Academy changhui090504@126.com 
FU Li School of Electronics and Information, Northwestern Polytechnical University  
SI Jun-Jie China Airbome Missile Academy  
WANG Wei China Airbome Missile Academy  
LV Yan-Qiu China Airbome Missile Academy  
LU Zheng-Xiong China Airbome Missile Academy  
WANG Jin-Chun China Airbome Missile Academy  
基金项目:航空创新基金(2011D01406)
中文摘要:相连缺陷元识别定位一直是面阵探测器研究难点。本文报道了面阵探测器相连缺陷元识别定位的研究成果。面阵探测器相连缺陷元的光电信号与正常元基本相同,因此采用现有面阵测试方法无法识别相连缺陷元。针对相连缺陷元的特点,提出了借助改变面阵探测器光电响应的方法来实现相连缺陷元的识别定位。实验结果表明该方法使面阵探测器分为两个不同透过率探测单元,多元相连缺陷元响应电压是相对应的两个不同透过率探测单元响应电压之和的平均值。采用MATLAB软件对测试数据进行分析处理,分析结果清晰给出缺陷元诸如个数、形状和位置等详细信息。采用本方法面阵探测器相连缺陷元可以被显著识别定位。研究结果为今后的面阵探测器评测与可靠性提高提供了参考。
中文关键词:面阵探测器  相连缺陷元识别  缺陷元定位  缺陷  红外
 
Study on Identification and Orientation of Connected Defective Elements in FPA
Abstract:As we know, it is difficult to identify connected defective elements by FPA test-bench because the response voltage of connected defective elements is basically the same as that of normal pixels. In this paper identification and orientation of connected defective elements in focal plane array (FPA) are presented. To characteristic of connected defective elements, we proposed a novel method which realizes the identification and orientation of connected defective elements by measuring the response voltage of detectors. Results show that the response voltage of detector can be divided into two sections by using the proposed method. The response voltage of connected defective elements is average of corresponding response voltage of the two sections units. The test data is analyzed by MATLAB software and the particular information of connected defective elements such as number, shape and location is shown. The connected defective elements are identified and orientated markedly by the technique. Our study presents a crucial step for testing and evaluating FPA.
keywords:Focal plane array  connected defective elements identification  defective elements orientation  defective  infrared
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