1.Key Laboratory of Electronic Testing Technology, School of Instrument and Electronics, North University of China, Taiyuan 030051, China;2.School of Semiconductors and Physics, North University of China, Taiyuan 030051, China
General Program of National Natural Science Foundation of China (62373331), Joint Funds of the National Natural Science Foundation of China (U21A20141), Innovative Research Group Project of the National Natural Science Foundation of China (51821003), Natural Science Foundation of Shanxi Province (202403021211095).
