Mathematical model of pixel coupling in high-density planar InGaAs focal plane arrays
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Affiliation:

1.National Key Laboratory of Infrared Detection Technologies, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai 200083, China;2.University of Chinese Academy of Sciences, Beijing 100049, China

Clc Number:

TN215

Fund Project:

Supported by the National Natural Science Foundation of China (62175250)

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    Abstract:

    The application of InGaAs focal plane arrays (FPAs) requires high density and small pixel pitch. However, as the pixel pitch decreases, the pixel coupling becomes stronger. By fabricating 5 μm pitch InGaAs arrays with different scales, the pixel coupling effects in high-density InGaAs arrays were studied. Innovatively, matrix equations were introduced to describe the contributions of dark current from each part, and a mathematical model of pixel coupling was constructed, and the contributions of the dark current resulting from the coupling effects were quantitatively analyzed. The results indicated that at a bias voltage of -0.1 V, reverse-biased pixels in the array can reduce the dark current of adjacent reverse-biased pixels by 21.39% of the pixel''s initial dark current. In contrast, zero-biased pixels can increase the dark current of adjacent reverse-biased pixels by 219.42%. Based on this high-density focal plane pixel coupling model, the impact rules of pixel coupling on dark current have been summarized, providing new insights for dark current research in high-density InGaAs focal plane arrays.

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DU Ai-Bo, YU Chun-Lei, SHAO Xiu-Mei, YU Jin-Ying, BAO Peng-Fei, LU Jin-Su, YANG Bo, ZHU Xian-Liang, LI Xue. Mathematical model of pixel coupling in high-density planar InGaAs focal plane arrays[J]. Journal of Infrared and Millimeter Waves,2025,44(4):496~502

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History
  • Received:November 14,2024
  • Revised:May 22,2025
  • Adopted:February 13,2025
  • Online: May 12,2025
  • Published:
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