1.State Key Laboratory of Nuclear Power Safety Monitoring Technology and Equipment, China Nuclear Power Engineering Co., Ltd., Shenzhen 518172, China;2.School of Materials Science and Engineering, Shanghai University, Shanghai, 200072, China;3.Key Laboratory of infrared imaging materials and detectors, Shanghai Institute of Technical Physics, Chinese Academy of Sciences,Shanghai, 200083, China;4.Intensive Care Unit, Yangpu District Shidong Hospital, , Shanghai 200438, China;5.School of Physical Science and Technology, Suzhou University of Science and Technology, Suzhou 215009, China;6.Zhejiang Institute of Advanced Materials, SHU, Jiashan 314113, China
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Supported by Open Topic of the State Key Laboratory of Nuclear Power Safety Monitoring Technology and Equipment (K-A 2019.418), and Open Topic of Key Laboratory of Infrared Imaging Materials and Devices (IIMDKFJJ-20-01)
CAO Meng, YU Bin, ZHANG Xiang, XU Cheng-Gang, ZHANG Shan, SUN Li-Ying, TAN Xiao-Hong, JIANG Yu-Cheng, DOU Jia-Wei, WANG Lin-Jun. Photoelectrochemical properties of sputtered n-type CdTe thin films[J]. Journal of Infrared and Millimeter Waves,2022,41(4):659~667
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