NOVEL THERMAL CYCLE SCREENING EQUIPMENT FOR CRYOGENIC SEMICONDUCTOR COMPONENTS
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TN306

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WU Li-Gang, LIU Da-Fu, ZHU San-Gen, WU Jia-Rong, HONG Si-Min, GONG Hai-Mei. NOVEL THERMAL CYCLE SCREENING EQUIPMENT FOR CRYOGENIC SEMICONDUCTOR COMPONENTS[J]. Journal of Infrared and Millimeter Waves,2006,25(2):153~156

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  • Received:March 23,2005
  • Revised:September 21,2005
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