CRYSTAL STRUCTURE, SURFACE MORPHOLOGY, DEPTH PROFILE OF ELEMENTS AND MID-INFRARED OPTICAL CONSTANTS OF TE-RICH LEAD TELLURIDE FILMS
DOI:
Author:
Affiliation:
Clc Number:
TN248.4 O484
Fund Project:
Article
|
Figures
|
Metrics
|
Reference
|
Related
|
Cited by
|
Materials
|
Comments
Abstract:
The characterizations of Te-rich PbTe layer thermal-evaporated from an excess of Te (<1 mol.%) evaporable materials were reported. The results reveal that the films obtained are polycrystalline and have single-phase NaCl-type PbTe crystal structure. It is also demonstrated that the films have homogeneous surface morphology and homogeneous distribution of Te-rich components along the layer in the range of 170 nm. The study on mid-infrared optical constants of film surface-polished indicates that the influence of surface scattering on optical properties is very small.
Reference
Related
Cited by
Get Citation
LI Bin, ZHANG Su-Ying, XIE Pin, ZHANG Feng-Shan. CRYSTAL STRUCTURE, SURFACE MORPHOLOGY, DEPTH PROFILE OF ELEMENTS AND MID-INFRARED OPTICAL CONSTANTS OF TE-RICH LEAD TELLURIDE FILMS[J]. Journal of Infrared and Millimeter Waves,2005,24(1):23~26