A NEW TECHNIQUE FOR DIELECTRIC MEASUREMENT OF DOUBLE-LANERED DIELECTRIC SAMPLES USING A QUASI-OPTICAL RESONATOR AT MILLIMETER WAVE BANDS
DOI:
Author:
Affiliation:

Clc Number:

TM930.126

Fund Project:

  • Article
  • |
  • Figures
  • |
  • Metrics
  • |
  • Reference
  • |
  • Related
  • |
  • Cited by
  • |
  • Materials
  • |
  • Comments
    Abstract:

    A new technique for diclectric measurement of double-layered dielectric samples using a quasi-optical resonator at millimeter wave bands is proposed. At 8 mm band. a set of quasi-optical resonator measurement system was set up, and a number of double layered dielectric samples were measured.

    Reference
    Related
    Cited by
Get Citation

Xia Jun, Liang Changhong. A NEW TECHNIQUE FOR DIELECTRIC MEASUREMENT OF DOUBLE-LANERED DIELECTRIC SAMPLES USING A QUASI-OPTICAL RESONATOR AT MILLIMETER WAVE BANDS[J]. Journal of Infrared and Millimeter Waves,1994,13(4):285~288

Copy
Share
Article Metrics
  • Abstract:
  • PDF:
  • HTML:
  • Cited by:
History
  • Received:
  • Revised:
  • Adopted:
  • Online:
  • Published: