CHENG Long
Hefei National Laboratory for Physical Sciences at the Microscale, University of Science and Technology of ChinaWANG Dong-Li
Hefei National Laboratory for Physical Sciences at the Microscale, University of Science and Technology of ChinaDAI Si-Yuan
Department of Physics, The University of California at San DiegoYAN Yue-Dong
Hefei National Laboratory for Physical Sciences at the Microscale, University of Science and Technology of ChinaFAN Xiao-Dong
Hefei National Laboratory for Physical Sciences at the Microscale, University of Science and Technology of ChinaWEI Lai-Ming
Hefei National Laboratory for Physical Sciences at the Microscale, University of Science and Technology of ChinaZENG Chang-Gan
Hefei National Laboratory for Physical Sciences at the Microscale, University of Science and Technology of ChinaHefei National Laboratory for Physical Sciences at the Microscale, University of Science and Technology of China,Hefei National Laboratory for Physical Sciences at the Microscale, University of Science and Technology of China,Department of Physics, The University of California at San Diego,Hefei National Laboratory for Physical Sciences at the Microscale, University of Science and Technology of China,Hefei National Laboratory for Physical Sciences at the Microscale, University of Science and Technology of China,Hefei National Laboratory for Physical Sciences at the Microscale, University of Science and Technology of China,Hefei National Laboratory for Physical Sciences at the Microscale, University of Science and Technology of China
CHENG Long, WANG Dong-Li, DAI Si-Yuan, YAN Yue-Dong, FAN Xiao-Dong, WEI Lai-Ming, ZENG Chang-Gan. Near-field imaging of theLaAlO3SrTiO3 interfacial conductivity[J]. Journal of Infrared and Millimeter Waves,2017,36(5):534~538
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