Structural and optical properties of CdS thin films prepared by RF sputtering
DOI:
Author:
Affiliation:
Shanghai University of Electric Power,Shanghai University,Shaoxing University
Clc Number:
Fund Project:
Article
|
Figures
|
Metrics
|
Reference
|
Related
|
Cited by
|
Materials
|
Comments
Abstract:
Cadmium sulfide thin films were grown on transparent conductive oxide coated glass substrates by radio frequency magnetron sputtering with a substrate temperature ranging from 30℃ to 200℃. X-ray diffraction measurements reveal that cadmium sulfide films were polycrystalline with the hexagonal wurtzite structure. The scanning electron microscope images show a good crystalline quality of the films which can also be confirmed by the Raman spectra, ultraviolet-visible absorption spectra and the photoluminescence spectroscopy. The Raman spectra measurements indicate that the compressive stress in the CdS films increases with increasing growth temperature.
Reference
Related
Cited by
Get Citation
ZHU Yan-Yan, XU Run, FANG Ze-Bo. Structural and optical properties of CdS thin films prepared by RF sputtering[J]. Journal of Infrared and Millimeter Waves,2014,33(1):40~44