The data requirements of all parameters on the performance test of infrared focal plane arrays (IRFPA) was analyzed, and then presented an efficient data acquisition method different from the traditional one. As a result of ADI latest high-performance 16-bit ADC and this new method, a high-efficiency high-accuracy data acquisition system was introduced. By the embedded RMS Hardware Algorithm and the particular combination of external SRAMs, this scheme is not only compatible with conventional test system, but also improves the efficiency of the test system greatly at the same time. Through experiments on HgCdTe 640?512(15 μm) IRFPA, the noise floor of the acquisition system is down to 75 μVrms and the calculation of various parameters can be completed in about 2 seconds. The data acquisition system is proved to be able to meet the demanding requirements for full IRFPA test and will have a great application prospect relatively to the traditional one.