Ka波段相控阵雷达TR组件幅相控制芯片的大功率微波非线性效应研究
投稿时间:2018-08-11  修订日期:2018-11-19  点此下载全文
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作者单位E-mail
郭 彍 电子科学与工程学院 guoguouestc@126.com 
许 雄 电子信息系统复杂电磁环境效应国家重点实验室  
魏彦玉 电子科学与工程学院  
郭长永 南阳技师学院  
基金项目:国家自然科学基金项目(面上项目,重点项目,重大项目)
中文摘要:本文采用实验测试和理论分析的方法研究了幅相控制芯片的大功率微波非线性效应。该芯片应用于Ka波段相控阵雷达收发组件中。测试平台利用固态源和脉冲磁控管来产生Ka波段大功率微波。随着输入功率幅值的提高,在实验中很明显地观测到了芯片的降级和毁伤现象。本文通过一系列的实验测试得到了芯片的全态相移特性和降级阈值,并通过图片给出了实验结果。最后,通过理论分析给出了该芯片的毁伤机理。
中文关键词:实验测试  大功率微波  非线性效应  幅相控制芯片  T/R组件
 
Investigation of Large Power Microwave Nonlinear Effects on Amplitude-phase Controller Chip for Ka-band Phased Array Radar T/R modules
Abstract:Large power microwave nonlinear effects on amplitude-phase controller chip are experimentally tested and theoretical analyzed. This chip has the typical application on Ka-band phased array radar (PAR) transmit/receive (T/R) modules. The test platform is built up by a solid source and a pulsed magnetron to generate large power Ka-band microwave. The degradation and destroy phenomenon are observed distinctly as the input power amplitudes are improved. The total-state phase characteristics and the degradation thresholds of the selected chip are obtained through a series of experimental tests. At last, the results are given by figures and the damage mechanism is analyzed theoretically.
keywords:Experimental test  large power microwave  nonlinear effects  amplitude-phase controller chip  T/R modules.
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