可见近红外波段碲镉汞材料光学常数测定与宽谱增透设计
投稿时间:2017-08-10  修订日期:2017-08-14  点此下载全文
引用本文:
摘要点击次数: 18
全文下载次数: 
作者单位E-mail
樊华 中国科学院上海技术物理研究所;中国科学院大学 sinohua@163.com 
张文杰 中国科学院上海技术物理研究所  
马小凤 中国科学院上海技术物理研究所  
廖清君 中国科学院上海技术物理研究所  
胡晓宁 中国科学院上海技术物理研究所 xnhu@mail.sitp.ac.cn 
基金项目:中国科学院GF创新基金(CXJJ-16S011)
中文摘要:将碲镉汞(Hg1-xCdxTe)红外焦平面器件衬底去除后,其响应波段可拓展到可见光波段,在高光谱成像应用中可显著减小系统的尺寸和重量,对光电探测系统的小型化和微型化具有重要实用价值。而明确碲镉汞材料在可见近红外波段的光学常数,对碲镉汞器件在这一响应波段的性能研究具有重要意义。分别测量了不同组分碲镉汞材料的椭圆偏振光谱,拟合得到了其在400~1600nm波段范围内的光学常数值,并利用反射光谱对获得的光学常数进行了验证。采用这些碲镉汞外延材料光学常数测量值,并选用ZnS和YF3分别作为高低折射率的增透膜材料,针对不同响应波段的背入射可见近红外碲镉汞焦平面器件,设计了不同的宽谱增透膜系,响应波段范围内的平均透过率高于90%。
中文关键词:碲镉汞  可见近红外  光学常数  增透膜
 
Optical constants of Hg1-xCdxTe and Design broadband AR coatingsfrom Visible to Near-infrared
Abstract:The response spectrum of Hg1-xCdxTe infrared focal plane detector can extend to visible band when its substrate removed. If such detectors are applied in hyperspectral imaging, the size and weight of the system can be significantly reduced, which is important for miniaturization of photoelectric detection system. Understanding the optical constants of Hg1-xCdxTe materials in visible and near infrared band has great significance to further study the performance of Hg1-xCdxTe device in this response band. The ellipsometric spectra of different components of Hg1-xCdxTe materials are measured and fitted, the optical constants are obtained in the 400~1600nm and verified by reflection spectra. By using the measured optical constants of Hg1-xCdxTe and selecting ZnS and YF3 as antireflective coating materials for high and low refractive index respectively, we design the different wide spectrum antireflection coatings corresponding to different response spectrum band of back illuminated visible to near infrared Hg1-xCdxTe focal plane device, and average transmittance of antireflective coatings in response range are higher than 90%.
keywords:Hg1-xCdxTe, Visible to near-infrared, Optical constant, Antireflection coatings
  查看/发表评论  下载PDF阅读器

版权所有:《红外与毫米波学报》编辑部