基于双波片的偏振调控和偏振测量技术
投稿时间:2016-12-30  修订日期:2017-04-11  点此下载全文
引用本文:李亚红,付跃刚,贺文俊,刘智颖,赵宇.基于双波片的偏振调控和偏振测量技术[J].红外与毫米波学报,2017,36(4):425~431].LI Ya-Hong,FU Yue-Gang,HE Wen-Jun,LIU Zhi-Ying,ZHAO Yu.Polarization control and measurement technology using a biplate[J].J.Infrared Millim.Waves,2017,36(4):425~431.]
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作者单位E-mail
李亚红 长春理工大学 光电工程学院 irene1129@163.com 
付跃刚 长春理工大学 fuyg@cust.edu.cn 
贺文俊 长春理工大学  
刘智颖 长春理工大学 lzy@cust.edu.cn 
赵宇 长春理工大学  
基金项目:国家自然科学基金项目(面上项目,重点项目,重大项目)
中文摘要:针对双波片偏振调控结构,基于Stokes-Mueller矩阵偏振算法,对双1/4波片和双1/2波片的偏振调控机理作了详尽的理论分析,得出调控偏振态与双波片快轴方向之间的关系,并追迹其在庞加莱球上的运动轨迹。基于双波片调控结构搭建偏振测量系统,根据入射和出射Stokes矢量构建了投影关系矩阵算法,完成了待测元件Mueller矩阵的测量,并分析了波片的快轴方向误差和位相延迟误差对Mueller矩阵测量结果以及对出射偏振态调控精度的影响。结果分析表明:波片的快轴方向误差控制在±2°内,位相延迟误差不大于λ/300时, Mueller矩阵的最大测量误差为0.0402,波片自身误差对测量结果的影响可以忽略不计;波片自身误差所引起的方位角误差不大于0.16 rad时,快轴方向误差引起的椭率角误差最大不超过0.032 rad,位相延迟误差导致的椭率角误差小于0.015 rad,且对偏振度无影响。
中文关键词:双波片  Stokes-Mueller矩阵  偏振调控  偏振测量  投影关系矩阵
 
Polarization control and measurement technology using a biplate
Abstract:Based on the Stokes-Mueller matrix polarization algorithm, the polarization control mechanism of biplate that consists of double single quarter wave-plates or half wave-plates was analyzed in detail. We have derived the analytical relations between the modulated polarization state and the fast-axis direction for the biplate and obtained the movement trajectory of modulated polarization state on the Poincaré sphere, which helped us to propose a polarization control measurement system using a biplate to complete the measurement of the Mueller matrix based on the projection matrix algorithm for the incident and exiting Stokes vectors and the analysis of polarization control accuracy for the exiting Stokes vector. Experimental results performed on such a biplate that the fast axis direction error is ± 2 °, and the retardance error is λ/300 demonstrated that the maximum measurement error of Mueller matrix is 0.0402, When the azimuth error caused by the error of the biplate is less than 0.16 rad, the elliptic angle error caused by the fast axis direction is not more than 0.032 rad, the ellipsometry error caused by the retardance is less than 0.015 rad, and it has no influence on the degree of polarization.
keywords:biplate  Stokes-Mueller matrix  polarization control  polarization measurement  projection matrix
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