复旦大学信息科学与工程学院，上海超精密光学制造工程技术研究中心，上海 200433,复旦大学信息科学与工程学院，上海超精密光学制造工程技术研究中心，上海 200433,复旦大学信息科学与工程学院，上海超精密光学制造工程技术研究中心，上海 200433,复旦大学信息科学与工程学院，上海超精密光学制造工程技术研究中心，上海 200433,复旦大学信息科学与工程学院，上海超精密光学制造工程技术研究中心，上海 200433,复旦大学信息科学与工程学院，上海超精密光学制造工程技术研究中心，上海 200433,中国科学院上海技术物理研究所，中国科学院红外成像材料与器件重点实验室，上海 200083,中国科学院上海技术物理研究所，中国科学院红外成像材料与器件重点实验室，上海 200083,中国科学院上海技术物理研究所，中国科学院红外成像材料与器件重点实验室，上海 200083
国家自然科学基金项目（面上项目，重点项目，重大项目）
Shanghai Engineering Research Center of Ultra-Precision Optical Manufacturing and Department of Optical Science and Engineering,Fudan University,Shanghai,Shanghai Engineering Research Center of Ultra-Precision Optical Manufacturing and Department of Optical Science and Engineering,Fudan University,Shanghai,Shanghai Engineering Research Center of Ultra-Precision Optical Manufacturing and Department of Optical Science and Engineering,Fudan University,Shanghai,Shanghai Engineering Research Center of Ultra-Precision Optical Manufacturing and Department of Optical Science and Engineering,Fudan University,Shanghai,Shanghai Engineering Research Center of Ultra-Precision Optical Manufacturing and Department of Optical Science and Engineering,Fudan University,Shanghai,Shanghai Engineering Research Center of Ultra-Precision Optical Manufacturing and Department of Optical Science and Engineering,Fudan University,Shanghai,Key Laboratory of Infrared Image Materials and Devices, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai 200083, China,Key Laboratory of Infrared Image Materials and Devices, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai 200083, China,Key Laboratory of Infrared Image Materials and Devices, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai 200083, China
王子仪,张荣君,唐彬,孙远程,许骥平,郑玉祥,王松有,陈良尧,樊华,廖青君,魏彦锋.唯一性检测在椭圆偏振光谱薄膜拟合中的应用[J].红外与毫米波学报,2015,34(6):663~667]. WANG Zi-Yi, ZHANG Rong-Jun, TANG Bin, SUN Yuan-Cheng, XU Ji-Ping, ZHENG Yu-Xiang, WANG Song-You, CHEN Liang-Yao, FAN Hua, LIAO Qing-Jun, WEI Yan-Feng. Uniqueness test for thin film fitting in spectroscopic ellipsometry[J]. J. Infrared Millim. Waves,2015,34(6):663~667.]
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