铬掺杂0.2PZN-0.8PZT压电陶瓷的XRD和Raman散射分析
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O437.3

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河南工业大学校科研和教改项目


XRD AND RAMAN SCATTERING ANALYSIS ON CHROMIUMDOPED 0.2PZN-0.8PZT PIEZOCERAMICS
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    摘要:

    采用XRD与Raman散射研究了Cr掺杂0.2PZN-0.8PZT压电陶瓷微观结构的变化.Cr掺杂导致三方-四方相变和晶体四方度增大,Raman散射关于晶格参数和相结构的分析得到了XRD的验证.通过研究不同结构中Raman振动模式,可揭示掺杂诱导的两相共存压电陶瓷微观结构的变化.

    Abstract:

    The microstructural changes originated from Cr doping in 0.2PZN-0.8PZT piezoelectric ceramics were investigated by means of XRD and Raman scatteringl The phase transition from rhombohedral to tetragonal and the increase of crystal tetragonallity are caused by Cr addition. The studies about the lattice parameters and the phase transition through Raman scattering are confirmed by XRD. So, the microstructural changes induced by doping in the piezoelectric ceramics with tetragonal and rhombohedral structures simultaneously can be revealed through the analysis of the Raman vibration modes in different structures.

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路朋献,许德合,马秋花,王改民,侯永改,周文俊,栗政新.铬掺杂0.2PZN-0.8PZT压电陶瓷的XRD和Raman散射分析[J].红外与毫米波学报,2007,26(1):69~]. LU Peng-Xian, XU De-He, MA Qiu-Hua, WANG Gai-Min, HOU Yong-Gai, ZHOU Wen-Jun, LI Zheng-Xin. XRD AND RAMAN SCATTERING ANALYSIS ON CHROMIUMDOPED 0.2PZN-0.8PZT PIEZOCERAMICS[J]. J. Infrared Millim. Waves,2007,26(1):69~.]

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  • 收稿日期:2006-04-24
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