王正秋 龚海梅.非接触式半导体少子寿命测试方法——微波反射法[J].红外与毫米波学报,1996,15(1):77~80]. Wang Zhengqiu Gong Haimei Li Yanjin Zhou Baoqing Fang Jiaxiong. STUDY OF MINORITY CARRIER LIFETIME IN SEMICONDUCTORS BY CONTACTLESS MEASUREMENT METHOD:MICROWAVE REFLECTANCE TECHNIQUE[J]. J. Infrared Millim. Waves,1996,15(1):77~80.]