(英)硫代硫酸钠浓度对电沉积制备铜锌锡硫硒薄膜性质的影响
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华东师范大学,上海太阳能电池研究与发展中心,中科院上海技术物理研究所,华东师范大学,上海太阳能电池研究与发展中心,上海太阳能电池研究与发展中心,上海太阳能电池研究与发展中心,中科院上海技术物理研究所,华东师范大学,华东师范大学

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国家自然科学基金项目(面上项目,重点项目,重大项目)


Effect of Na2S2O3·5H2O concentration on the properties of Cu2ZnSn(S, Se)4 thin films fabricated by selenization of co-electroplated Cu-Zn-Sn-S precursors
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East China Normal University,Shanghai Center for Photovoltaics,Shanghai Institute of Technical Physics, Chinese Academy of Science,East China Normal University,Shanghai Center for Photovoltaics,Shanghai Center for Photovoltaics,Shanghai Center for Photovoltaics,Shanghai Institute of Technical Physics, Chinese Academy of Science,East China Normal University,East China Normal University

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    摘要:

    采用后硒化Cu-Zn-Sn-S电沉积预制层的方法制备了铜锌锡硫硒薄膜,其中Cu-Zn-Sn-S预制层是通过含有不同浓度的硫代硫酸钠电解液电沉积而成的.实验发现,硒化前后薄膜的性质与硫代硫酸钠浓度密切相关.SEM,EDS,XRD,Raman和透射光谱分析表明,当硫代硫酸钠的浓度为5 mM时,沉积的薄膜形貌平整,晶粒明显,组分贫锌,具有单一的铜锌锡硫硒结构,且其带隙为1.11 eV; 在浓度高于5 mM下沉积的薄膜形貌粗糙并产生杂相硒化锡; 在浓度低于5 mM下沉积的薄膜组分严重贫锌并生成大量的Cu2SnSe3.

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    Cu2ZnSn(S, Se)4 films were fabricated through post-selenization of Cu-Zn-Sn-S precursors co-electroplated by varied Na2S2O3·5H2O concentrations. The property of obtained films before and after selenization shows a close dependence on the concentration of Na2S2O3·5H2O. Only the film grown by 5 mM of Na2S2O3·5H2O shows a uniform surface with faceted grains, a Zn-poor composition, a single phased Cu2ZnSn(S, Se)4 structure and a 1.11 eV band gap evidencing by SEM, EDS, XRD, Raman and transmittance spectra. More than 5 mM of Na2S2O3·5H2O additive to the electrolyte yielded the films with rougher morphology and the presence of SnSex. Less than 5 mM of Na2S2O3·5H2O additive to the electrolyte resulted in the films with highly Zn-poor content and the primary formation of Cu2SnSe3.

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葛杰,江锦春,胡古今,张小龙,左少华,杨立红,马建华,曹蒙,杨平雄,禇君浩.(英)硫代硫酸钠浓度对电沉积制备铜锌锡硫硒薄膜性质的影响[J].红外与毫米波学报,2013,32(4):289~293]. GE Jie, JIANG Jin-Chun, HU Gu-Jin, ZHANG Xiao-Long, ZUO Shao-Hua, YANG Li-Hong, MA Jian-Hua, CAO Meng, YANG Ping-Xiong, CHU Jun-Hao. Effect of Na2S2O3·5H2O concentration on the properties of Cu2ZnSn(S, Se)4 thin films fabricated by selenization of co-electroplated Cu-Zn-Sn-S precursors[J]. J. Infrared Millim. Waves,2013,32(4):289~293.]

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  • 收稿日期:2012-08-24
  • 最后修改日期:2013-04-02
  • 录用日期:2012-11-22
  • 在线发布日期: 2013-08-29
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